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PM Tour Vienna

20. May 2025 Save date

There are many different kinds of disperse systems - like powders, granules, fibres, suspensions, emulsions or aerosols. Depending on size and shape of the particles, they show different behaviours as a result of their physical properties. But what do they all have in common? They determine the quality of your final product.

 

Only if these particle properties are measured can they be controlled. In order to measure right - reliable, time and again - we design our instruments to be adaptable to the specific needs of your product. To discover how we might fulfil your requirements, we invite you to this year's Sympatec Particle Measurement Tour at selected locations across Europe. Samples are welcome.

 

We look forward to seeing you!

Meeting venue: NH Vienna Airport


Register

Program

Time Topic Speaker

09.00

Registration

Sebastian Veit
Sales Engineer
 

09.15

Welcome

Dr Torsten Hübner
Sales Manager Europe

09.25

Better particles ...
... with best instruments
for particle characterisation

Dr Torsten Hübner

09.45

RODOS | QUIXEL | TWISTER & Co.
Sample handling, preparation and product-specific dispersion in dry, wet and spray applications

Maximilian Beyer
Sales Engineer

10.10

HELOS | MYTOS & Co. | with applications
Particle size analysis with classic laser diffraction

Laboratory | modular | 0.1 µm to 8,750 µm
Process | in-line | 0.25 µm to 3,500 µm

Sebastian Veit
Maximilian Beyer

11.15

Coffee break

11.30

QICPIC | PICTOS & Co | with applications
Dynamic image analysis for size and shape characterisation

Laboratory | modular | < 1 µm to 34,000 µm
Process | on-line | 2 µm to 20,480 µm

Dr Torsten Hübner
Maximilian Beyer

12.25

NANOPHOX | with applications
Analysis of particle size and stability with PCCS in even high concentrated nanodispersions

Laboratory | 0.5 nm – 10,000 nm

Dr Torsten Hübner

12.55

OPUS | NIMBUS | with applications
Analysis of particle size and concentration with ultrasonic extinction in opaque dispersions

Process and laboratory | < 0.1 µm to 3,500 µm

Maximilian Beyer

13.15

Invitation for Lunch

14.00

Live-Workshop | Your samples are welcome!
Hands-on particle characterisation in small groups with HELOS | QICPIC | NANOPHOX

Dr Torsten Hübner
Sebastian Veit
Maximilian Beyer

17.00

Finale  ... extended on demand ...

PMT Wien
Wien | AT

Particle Measurement Tour Registration

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